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Angle‐resolved XPS study of the effect of x‐radiation on the aging of polystyrene exposed to an oxygen/argon plasma
Author(s) -
Paynter R. W.
Publication year - 2002
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1155
Subject(s) - x ray photoelectron spectroscopy , polystyrene , contact angle , argon , oxygen , analytical chemistry (journal) , irradiation , chemistry , materials science , plasma , polymer , nuclear magnetic resonance , composite material , chromatography , organic chemistry , physics , nuclear physics , quantum mechanics
Polystyrene films spin‐coated onto glass were exposed to an oxygen/argon plasma. The depth profile of the oxygen in the polystyrene surface was characterized by angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) 2, 24 and 92 h following the plasma treatment. It was found that oxygen was lost from the surface over time, mainly from C O and especially O CO O groups, and that the exposure to x‐rays during the ARXPS measurement accelerated this loss. At the 92 h mark, a linear, negative correlation was found between the oxygen content of the polystyrene surface and the water contact angle. The relative merits of the three models used to interpret the ARXPS data are discussed. Copyright © 2002 John Wiley & Sons, Ltd.