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Apatite films produced by electrodeposition: characterization by TEM and AFM
Author(s) -
Manso Miguel,
Jiménez Carmen,
Morant Carmen,
Herrero Pilar,
MartínezDuart J. M.
Publication year - 2001
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1153
Subject(s) - apatite , nucleation , transmission electron microscopy , characterization (materials science) , materials science , microstructure , nanocrystal , high resolution transmission electron microscopy , chemical engineering , thin film , atomic force microscopy , nanotechnology , mineralogy , analytical chemistry (journal) , chemistry , metallurgy , organic chemistry , engineering , chromatography
Apatite films have been grown by a method involving both physical and chemical processes. The spontaneous nucleation of apatite crystals on the surface of Ti/Si and Si substrates was activated by applying positive constant potentials. The surface morphology and microstructure of these films have been studied. Several apatite‐like nanocrystals have been observed in the bulk by high‐resolution transmission electron microscopy. We also observed ordered structures with atomic resolution on the surface using atomic force microscopy. The results of the combined characterization suggest that this is a useful technique for low‐temperature deposition of thin apatite films on both semiconductor and metallic substrates. Copyright © 2001 John Wiley & Sons, Ltd.