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ToF‐SIMS ability to quantify surface chemical groups: correlation with XPS analysis and spectrochemical titration
Author(s) -
Médard N.,
Aouinti M.,
PoncinEpaillard F.,
Bertrand P.
Publication year - 2001
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1138
Subject(s) - titration , secondary ion mass spectrometry , chemistry , x ray photoelectron spectroscopy , surface modification , analytical chemistry (journal) , time of flight , high density polyethylene , mass spectrometry , polyethylene , inorganic chemistry , chemical engineering , chromatography , organic chemistry , engineering
Abstract High‐density polyethylene (HDPE) and polypropylene (PP) films were analysed by time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) in a quantitative way in order to study chemical modifications produced by CO 2 plasma surface treatments. Although there are many works devoted to the study of surface modification by plasma treatments, this contribution aims at proving the SIMS ability to quantify superficial functions. For that purpose, results obtained by spectrochemical titration (fluorescence labelling with thionine acetate), XPS measurement and ToF‐SIMS analyses were compared. The results obtained with these three different techniques showed the same behaviour, i.e. a fast carboxylic functionalization of the polymer surface with the plasma treatment time. The good correlation between the spectrochemical titration and ToF‐SIMS results brings out clearly the capacity of the ToF‐SIMS technique to quantify surface chemical species. But this requires that we should be able to identify the secondary ions originating from the studied functions. Copyright © 2001 John Wiley & Sons, Ltd.