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Reflection anisotropy spectroscopy: a new probe of metal surfaces
Author(s) -
Martin D. S.,
Weightman P.
Publication year - 2001
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1129
Subject(s) - anisotropy , reflection (computer programming) , spectroscopy , metal , materials science , semiconductor , spectral line , optics , analytical chemistry (journal) , chemistry , optoelectronics , nanotechnology , metallurgy , physics , chromatography , quantum mechanics , astronomy , computer science , programming language
Reflection anisotropy spectroscopy (RAS) is a non‐destructive optical probe of surfaces capable of operation within a wide range of environments. The RAS technique was developed to study semiconductor growth and more recently has been used to probe the optical properties of metal surfaces. Surface sensitivity has been demonstrated with the detection of reconstruction, adsorbate interaction and the observation of transitions involving surface‐localized electronic states. The RAS technique has non‐ultrahigh vacuum (UHV) environment capability and thus opens up the study of metal surfaces in catalytic and corrosive environments at high pressure and at the solid/liquid interface. The combination of RAS with a full range of surface science techniques applied to the study of well‐defined surfaces aids in the interpretation of RAS spectra. The focus of this article will be on well‐characterized metal surfaces prepared and studied under UHV conditions. Copyright © 2001 John Wiley & Sons, Ltd.