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Quantification from overlapping Auger peak‐to‐peak heights
Author(s) -
Asante J. K. O.,
Roos W. D.,
Maritz M. F.
Publication year - 2001
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1115
Subject(s) - auger , spectral line , chemistry , yield (engineering) , sampling (signal processing) , analytical chemistry (journal) , energy (signal processing) , atomic physics , computational physics , statistics , physics , mathematics , optics , thermodynamics , chromatography , quantum mechanics , detector
Auger peak‐to‐ peak‐heights (APPHs) in the derivative Auger spectra can be used during quantification to determine the fractions contributing to the Auger yield. The calculated APPH is stored during sampling, whereas the spectra are sometimes discarded. When peaks overlap, only the APPH of the combined spectrum is stored. In such cases, where the original spectra are no longer available, it is impossible to extract the contribution of each of the species from a single APPH. However, if APPHs have been sampled in two separate energy regions, both with overlapping peaks of the same species, it is possible again to extract the individual contributions provided that standards of both species (taken under similar conditions) are available. Because the APPH of the sum of two spectra is not the sum of the APPHs of the contributing spectra, the procedure involves simultaneous solution of two non‐linear equations. Copyright © 2001 John Wiley & Sons, Ltd.