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Detection of shear force with a piezoelectric bimorph cantilever for scanning near‐field optical microscopy
Author(s) -
Shang Guangyi,
Wang Chen,
Lei Hening,
Bai Chunli
Publication year - 2001
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1057
Subject(s) - bimorph , cantilever , near field scanning optical microscope , non contact atomic force microscopy , shear force , piezoelectricity , optical microscope , shear (geology) , optics , atomic force acoustic microscopy , materials science , microscopy , magnetic force microscope , kelvin probe force microscope , physics , scanning electron microscope , composite material , magnetic field , magnetization , quantum mechanics
We present a non‐optical shear force method to control the probe–sample distance for scanning near‐field optical microscopy (SNOM). In this system, the detection of shear force is accomplished by attaching a tapered fibre‐optic probe to a piezoelectric bimorph cantilever, which realizes the excitation and the detection simultaneously. The decrease in amplitude of the cantilever is observed when the probe approaches the sample and the shifts in resonance frequency are measured as a function of set‐point. The shear force images can be obtained reliably because the set‐point is >0.8. These results suggest that the system is reasonably sensitive to shear force and can be used easily for SNOM. Copyright © 2001 John Wiley & Sons, Ltd.