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Paper No P31: Optoelectronic Properties of MEH‐PPV Thin Films Influenced by their Thickness
Author(s) -
Urbanek Pavel,
Kuritka Ivo,
Krcmar Petr,
Maslik Jan
Publication year - 2013
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.32
Subject(s) - materials science , thin film , optoelectronics , chemical engineering , nanotechnology , engineering
Abstract In this paper, the influence of thickness on the optoelectrical properties of poly(2‐methoxy‐5‐(2′‐ethyl‐hexoxy)‐1,4‐phenyle‐ne‐vinylene) is discussed. The main goal of our measurements was to describe the relationship between thickness of films and their optoelectrical properties. We discovered that there is always certain minimum film thickness needed for development of conformational structure and for changes in optoelectrical behavior.