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Paper No P37: The Effect of Bias‐Temperature Stress on Threshold Voltage Instabilities in a‐IGZO Under Light Illumination and Their Modeling Equation
Author(s) -
Seok Su Jeong,
Kim Ohyun
Publication year - 2013
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.25
Subject(s) - stress (linguistics) , threshold voltage , materials science , voltage , optics , mechanics , physics , quantum mechanics , philosophy , linguistics , transistor
In this paper, we study about mechanism of threshold voltage shift in a‐IGZO TFT from measurement data of bias‐temperature stress (BTS) under light illumination and examine their modeling equation.