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P‐17.1: ASG with wide operating temperature
Author(s) -
Lou Tenggang,
Wang Lei,
Kong Xiangjian,
Liu Jine,
Qin Feng
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.15393
Subject(s) - electronic circuit , spice , backlight , reliability (semiconductor) , liquid crystal display , computer science , electronic engineering , engineering , electrical engineering , physics , operating system , quantum mechanics , power (physics)
We have fabricated LCD panels with ASG circuits which can endure 1000 hours reliability test in ‐30°C and 85°C environment. The ASG circuits has 9 TFTs and 2 capacities. We presented three formulas to characterize ASG performance in the high temperature RA test. Those formulas fit well with the performance of the products so can guide the ASG design. We use spice simulation to characterize the ASG performance in low temperature RA test. The simulation results can well represent the no display failure in low temperature. The ASG circuits works well after RA test while the backlight luminance reaches 30000nit. Meanwhile the ASG circuits support both updown scan and down‐up scan. The ASG circuits also support irregular active area. Those attributes can meet the demands of vehicle display.