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P‐13.14: Two Inspection Methods of Image Quality & Appearance Based on Edge Crack of OLED Display Module
Author(s) -
Bao Wenyu,
Chao Zhang,
Zhihui Yang,
Yuewei Xu,
Bao Wenyu
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.15371
Subject(s) - oled , enhanced data rates for gsm evolution , process (computing) , computer science , materials science , product (mathematics) , collision , quality (philosophy) , computer vision , optoelectronics , composite material , computer security , physics , layer (electronics) , quantum mechanics , operating system , geometry , mathematics
In the production process of OLED products, process cutting, transportation collision and so on may lead to cracks on the edge of the product, and the organic light‐emitting materials inside will be oxidized and eroded by water vapor due to the direct contact between cracks and air, resulting in serious poor functional display. And this process is progressive. At the initial stage, the defects are very subtle, which can not be identified by naked eyes and ordinary equipment. It is difficult to check and intercept, which has become the difficulty of the whole industry.