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P‐5.1: Research on the color shift mechanism model of TDDI product ESD test center
Author(s) -
Sun Le,
zhang Zhen,
Hou Jingwei,
Wang Xiaojie,
Zhao Xin,
Tang Wulijibaier,
Xie Jianyun
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.15290
Subject(s) - electricity , electrical conductor , static electricity , deflection (physics) , screen printing , liquid crystal display , flat panel display , electrical engineering , materials science , optoelectronics , composite material , engineering , optics , physics
As customers pursue the ultimate pursuit of the display effect of the screen (Panel), display panel manufacturers have increasingly higher requirements for the anti‐static (ESD) of the screen. In the process of testing the ESD performance of the screen, when a large amount of static electricity accumulates on the surface of the Panel, it will usually affect the deflection of the liquid crystal (LC), and the abnormal phenomenon of black and purple appears. This phenomenon is collectively called ESD color shift. At present, the most effective way to improve the color shift of ESD in the industry is to plate a high‐resistance film (ATO) on the surface of the display panel (Cell), that is, to plate a conductive layer with low resistance on the surface of the CF(Color Film). This conductive layer passes through the Ag on the TFT. The paste point leads to static electricity; however, due to the high cost of ATO, the production cost ofpanel manufacturers has increased significantly. On the premise of canceling the high‐resistance film, improving the ESD color shift of the screen has become a research hotspot in the industry. During the ESD test, the electrostatic gun hits the surface of the T‐LCM, and the static electricity will be transmitted down each layer of the T‐LCM. During this process, the static electricity can be exported through the conductive path designed on the T‐LCM. The conductive path cannot discharge static electricity in time, causing static electricity to reach the liquid crystal. The amount of charge reaching the liquid crystal directly determines whether the liquid crystal is deflected. If the static electricity reaching the liquid crystal is greater than the voltage at which the liquid crystal is deflected, the liquid crystal will be deflected, resulting in ESD color shift. Starting from the discussion of the ESD failure mechanism, this paper establishes an ESD color shift failure model; through the analysis of the product structure, each component in the product structure is regarded as an independent capacitor, and the chargedfilm layer (or Parts) quantify the impact of LC, obtain the key factors affecting ESD color shift through comparison, and provide certain guidance for subsequent product design and material selection. The improvement plan proposed in this article has been fully verified on our products, and the ESD color shift is effectively improved under the premise of canceling the high resistance film.