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P‐1.11: Effects of Source and Drain Contacts on Electrical Performance of Oxide Thin‐Film Transistors
Author(s) -
Wu Zhendong,
Zhang Hengbo,
Wang Xiaolong,
Liang Lingyan,
Cao Hongtao
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.15259
Subject(s) - chinese academy of sciences , engineering physics , engineering , zhàng , materials science , china , political science , law
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