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34.3: High Reliable Integrated Gate Driver GOA Circuit using Four‐Mask a‐Si TFT for Large Size UHD LCD TVs
Author(s) -
Cho An-thung,
Wei Chao,
Xia Yu-ming,
Zhang Yong,
Ding Jie,
Huang Chen-I,
Hu Yun-qin,
Tsai Yao-Feng,
Hsu James,
Chen Wade
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.15159
Subject(s) - thin film transistor , liquid crystal display , reliability (semiconductor) , gate driver , computer science , electrical engineering , computer hardware , engineering , materials science , optoelectronics , voltage , physics , power (physics) , nanotechnology , layer (electronics) , quantum mechanics
Gate driving circuit (GOA) design is critical to reduce the production cost and narrow border TFT‐LCD. The proposed GOA circuit has the optimized TFT W/L design and TFT stress reduction which enhances gate driver reliability for TV application. We developed 50UHD 120Hz TFT‐LCD with GOA circuit using 4‐mask a‐Si TFT.