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26.4: A Quantitative Method for L0 Light Leakage Sensitivity of TFT‐LCD Based on JND Energy Ratio
Author(s) -
Han-yan SUN,
Ming-hui ZHANG,
Wei-tao CHEN,
Xiao-peng CUI,
Xiao-jian YANG
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.15122
Subject(s) - repeatability , leakage (economics) , liquid crystal display , human eye , sensitivity (control systems) , computer science , optics , materials science , optoelectronics , artificial intelligence , mathematics , electronic engineering , engineering , statistics , physics , economics , macroeconomics
In this paper, a quantitative evaluation method of L0 light leakage sensitivity based on JND energy ratio is established by studying the optical characterization and physical significance of L0 light leakage phenomenon. This method uses continuous quantitative indicators instead of human eye evaluation, which fully improves the accuracy and repeatability, and it can also predict the L0 light leakage level after the test module is assembled into the system set. An optical test system was built to simulate the influence of the system set. The liquid crystal module samples with different glass thickness and different sealant were tested. The test results were consistent with the qualitative judgment results of the human eye after the test module is assembled into tablet PC, and the similar level that the human eye can't be distinguished can be quantitatively distinguished. The repeatability error of the method was only 0.89%.