Premium
19.4: Pixel‐Level Color Measurement Used for MicroLED Inspection Based on Imaging Spectrometer
Author(s) -
Luo Shiwen,
Hong Zhikun,
Zheng Zengqiang,
Zhao Biao,
Yin Zhengzheng,
Zheng Jiong
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.15087
Subject(s) - colorimeter , spectrometer , brightness , pixel , luminance , imaging spectrometer , optics , artificial intelligence , computer vision , computer science , spectral imaging , physics
With the development of MicroLED technology, MicroLED displays show attractive potential because of high brightness, high efficiency, low energy consumption and long lifetime. However, it's difficult to deal with MicroLED displays' defect inspection and color measurement because MicroLED displays usually contain millions of pixels which emit light separately. In this paper, pixel‐level color measurement based on imaging spectrometer is introduced which can be used for MicroLED inspection. The imaging spectrometer offers high color measurement accuracy under different conditions including luminance, spectral shape, bandwidth. Compared with colorimeter based on color camera, the imaging spectrometer offers better accuracy and robustness.