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P‐116: TADF OLED Emission Zone and Stability Analysis with Water Exposure to Different Layers During Deposition
Author(s) -
Ciarnáin Rossa Mac,
Mo Hin Wai,
Nagayoshi Kaori,
Fujimoto Hiroshi,
Harada Kentaro,
Ke Tung-Huei,
Heremans Paul,
Adachi Chihaya
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.14989
Subject(s) - oled , materials science , anode , stack (abstract data type) , layer (electronics) , optoelectronics , deposition (geology) , composite material , chemistry , electrode , computer science , sediment , biology , programming language , paleontology
Reliable devices are essential for the commercialization of OLED technology. OLED materials are notorious for their sensitivity to various substances such as water. For thermally activated delayed emission (TADF) OLEDs, which layers are most water‐sensitive is unknown. Work towards understanding how water affects OLED performance is shown. Surprisingly, it is shown that the water effect on the emission layer is negligible compared to other layers in this stack. The emission zone is measured for fresh and degraded OLEDs deposited under different water partial pressures. Using a novel highly sensitive measurement method, a shift to the anode side was observed.