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P‐91: Measuring the Profile of the Emission Zone and Dipole Orientation in OLED by Polarized Radiation
Author(s) -
Fan Yan,
Fan Xing,
Li Yansong,
Wu Qixiao,
Li Xin,
Gao Hao,
Wen Xiangmin,
Zhang Zhihui,
Li Xu,
Wang Yanming,
Han Cheng,
Li Na
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.14974
Subject(s) - oled , materials science , dipole , radiation , dopant , optoelectronics , orientation (vector space) , layer (electronics) , diode , optics , physics , doping , nanotechnology , geometry , mathematics , quantum mechanics
The profile of the emission zone and dipole orientation of dopants in organic light‐emitting diodes (OLEDs) are two typical optical properties and have great impacts on the device performance. In the present study, these properties were investigated using in‐situ angle resolved polarized radiation and optical simulations. The results show that the emission is generated within a ~9 nm wide sheet at the prime layer/emissive layer (EML) interface, and 94% of the dipoles are horizontally aligned.