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P‐87: Analysis and Validation of TFT‐LCD Horizontal Mura Mechanism
Author(s) -
Shao Yuan,
Tang Shi,
Yu Chengzhong,
He Yifeng,
Ching Hsieh Chung,
Xiao Juncheng,
Zhao Bin
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.14969
Subject(s) - mura , mechanism (biology) , reliability (semiconductor) , liquid crystal display , computer science , horizontal and vertical , process (computing) , reliability engineering , engineering , mathematics , physics , geometry , power (physics) , quantum mechanics , operating system
In this paper we reported a novel technology to improve Horizontal Mura. The relationship between process/material and horizontal light line is analyzed no matter wet or dry. After a lot of experimental verification and analysis of the mechanism. A method to assess Horizontal Mura risk is developed with corresponding Cu acid standards/process change to ensure product reliability requirements are met.