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P‐71: An Effective Quantification Method for Evaluating Horizontal Line Defects by Interference between Flexible OLED and Touch Sensor
Author(s) -
Ko Jun Young,
Kim Hyung-Bae,
Choi Jae Woo,
Seo Eun Sol,
Jin Shin Yu
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.14953
Subject(s) - oled , interference (communication) , line (geometry) , contrast (vision) , materials science , quality assurance , sensitivity (control systems) , optoelectronics , high contrast , computer science , optics , electronic engineering , nanotechnology , computer vision , medicine , telecommunications , engineering , physics , pathology , channel (broadcasting) , geometry , mathematics , layer (electronics) , external quality assessment
The absence of standardized methods of the visible defects quantification has induced inconsistent results in quality assurance of OLED displays. Herein, an effective quantification method for evaluating horizontal line defects by interference of flexible OLED and touch sensor were proposed and a specific contrast sensitivity (CS) levels below 1.0 was established as meaning “invisible defect”.