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P‐69: Correlated Double Sampling Circuit Integrated on Glass Used for Active Pixel Sensing Array
Author(s) -
Yuan Yi-Cheng,
Tu Cheng-Che,
Tai Ya-Hsiang
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.14951
Subject(s) - threshold voltage , correlated double sampling , thin film transistor , pixel , signal (programming language) , voltage , optoelectronics , materials science , capacitor , transistor , sampling (signal processing) , electrical engineering , computer science , optics , physics , engineering , cmos , nanotechnology , layer (electronics) , detector , amplifier , programming language
In recent years, promoting the sensing accuracy of the image pixel sensor has become a hot issue. For voltage type active pixel sensor (V‐APS), the readout voltage, as well as the sensing signal, will be affected by the thin film transistors (TFTs) characteristic variation, especially the shift in threshold voltage (Vth). In this paper, we introduce a novel correlated double sampling (CDS) circuit, which can be implemented on glass by only using TFTs and capacitors. Thus, the readout voltage variation due to the threshold voltage shift under same light intensity illumination can be eliminated.