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58‐1: Invited Paper: Overcoming the Challenges in microLED Inspection and Manufacturing
Author(s) -
Lewis David,
Dechter Rimma,
Ley Ryan,
Wong Matthew,
Khoury Michel
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.14808
Subject(s) - manufacturing engineering , characterization (materials science) , computer science , engineering , systems engineering , engineering drawing , nanotechnology , materials science
MicroLED displays offer many advantages over existing display technologies, but manufacturing challenges remain before they can be commercially viable. InZiv is developing new microLED inspection tools with the highest resolution in optical, spectral, and structural characterization. This paper reviews critical challenges facing the industry and solutions to address them.