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P‐13.5: The impact of Gate Loading on Image Quality for large & middle size AM‐OLED display devices
Author(s) -
Guobo Yang,
Haijun Qiu,
Weiyun Huang,
Yuqing Yang,
Yue Long,
Yao, Huang,
Xiping Li,
Yuanyou Qiu,
Kaipeng Sun,
Zhuolin Jiang,
Chao Zeng
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.14581
Subject(s) - mura , luminance , amoled , oled , chromatic scale , computer science , display size , image quality , computer graphics (images) , computer vision , image (mathematics) , materials science , display device , liquid crystal display , optics , thin film transistor , physics , layer (electronics) , nanotechnology , active matrix , operating system
This paper is aimed to study the effect on large and middle size AMOLED display device by gate loading. We discovered the reason for color shift Mura at low grey level through a series of DOE and simulation, and present several efficient solutions. Also we provide the formula of luminance and chromatic coordinate to estimate the Mura level, that can be generalized.