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15.3: Defect Engineering in n ‐Type Oxide Semiconductor TFTs
Author(s) -
Li Guoli,
He Jiawei,
Wang Huiru,
Flandre Denis,
Liao Lei
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.14391
Subject(s) - china , engineering physics , library science , physics , political science , computer science , law