Premium
71‐3: Meeting Optical Testing Challenges of High‐Resolution µLED‐Displays
Author(s) -
Steinel Tobias,
Wolf Martin
Publication year - 2020
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.14057
Subject(s) - pixel , luminance , metrology , computer science , calibration , quality (philosophy) , oled , computer graphics (images) , artificial intelligence , optics , materials science , physics , nanotechnology , layer (electronics) , quantum mechanics
Novel display technologies come with new measurement challenges to meet the highest quality standards in mass production. Here we shine light on these challenges and discuss innovative testing solutions to assure highest display quality in production takt times. We present how single pixel analysis can improve display quality by using a statistical approach to nonuniformity of luminance as well as color metrology on sub‐pixel level. Applications for smartphone displays and microdisplays are discussed emphasizing the challenges of very small pixels and pixel pitches. Finally, calibration of light measuring devices are challenged with respect to the specific spectral properties of µLEDs and OLEDs.