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71‐1: Fractional Pixel Method for Improved Pixel‐Level Measurement and Correction (Demura) of High‐Resolution Displays
Author(s) -
Pedeville Gary R.,
Rouse Joshua H.,
Kreysar Douglas F.
Publication year - 2020
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.14055
Subject(s) - pixel , luminance , artificial intelligence , computer vision , resolution (logic) , dot pitch , computer science , image sensor , display resolution , computer graphics (images) , display device , operating system
As display resolution and pixel density increase, measuring the characteristics (luminance, color) of individual display pixels becomes more difficult for existing imaging technology. This paper describes a method of display pixel measurement using fractional imaging sensor pixels to accurately measure pixel‐level luminance for emissive (OLED, microLED) display qualification and demura.