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64‐2: Metrology of Non‐Planar Light Sources Using Near‐Field Goniometric Measurement Method
Author(s) -
Käläntär K,
Tashiro Tomonori,
Toyota Toshihiro,
Yamauchi Yasuki
Publication year - 2020
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.14029
Subject(s) - goniometer , optics , metrology , zenith , azimuth , luminance , light source , physics , planar , system of measurement , computer science , computer graphics (images) , astronomy
In this paper we study the metrology issues of non‐planar light sources (NPLSs). We use near‐field (NF) goniometric measurement method to characterize the NPLSs. By using the NF method, we obtain the luminance image, the intensity, the spectra and the color of the source as a function of the ray angle, i.e., the zenith and azimuth angles in spherical coordinate system. The NF light rays are used to obtain the characteristics of the light source at far‐fields by post processing. The results of the NPLS metrology and the features of the NF goniometric measurement system are reported.