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43‐4: Combining steady‐state, frequency, and time domain data for a comprehensive analysis of multilayer TADF OLEDs
Author(s) -
Jenatsch Sandra,
Züfle Simon,
Blülle Balthasar,
Ruhstaller Beat
Publication year - 2020
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.13947
Subject(s) - oled , optoelectronics , characterization (materials science) , diode , materials science , time domain , charge carrier , steady state (chemistry) , frequency domain , charge (physics) , degradation (telecommunications) , computer science , electronic engineering , nanotechnology , physics , chemistry , telecommunications , engineering , layer (electronics) , quantum mechanics , computer vision
Typically, organic light‐emitting diodes (OLEDs) are characterized only in steady‐state to determine and optimize their efficiency. Adding further electro‐optical measurement techniques in frequency and time domain helps to quantify charge carrier dynamics and provides deeper insight into the device physics. Combining experimental characterization with electro‐optical device simulation allows one to determine specific material parameters such as the charge carrier mobilities of the layers. Moreover, the obtained device model enables a better understanding of the limitations and degradation pathways of the specific OLED device.

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