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37‐1: Yield Statistics for Fault Tolerant Micro LED Displays
Author(s) -
Ahmed Khaled
Publication year - 2020
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.13920
Subject(s) - redundancy (engineering) , backplane , wafer , wafer scale integration , computer science , pixel , fault tolerance , reliability engineering , electronic engineering , materials science , computer hardware , optoelectronics , engineering , artificial intelligence , distributed computing
Millions of μLEDs are transferred from donor wafers and integrated onto TFT backplanes to fabricate a μLED display. To guarantee that the number of defective pixels is zero, a fault‐tolerant design (e.g. redundancy) may be adopted. In this work, the required redundancy level is estimated for a given display resolution, and yields for the μLED donor wafers and the transfer process of μLED to the backplane. This is done using a novel mathematical yield model that is derived from first principles statistics. It is shown that without redundancy the wafer and transfer yields need to be > 99.9999% to hit a display line yield of 80%. With redundancy, the required wafer and transfer yields can be as low as 99.5% with 3× redundancy. The model results may be used to assess the capital requirements and the risk involved in fabricating μLED displays.