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P‐120: Degradation Mechanism and Lifetime Improvement of Blue Quantum‐Dot Light‐Emitting Diodes
Author(s) -
Ding Wen-Cheng,
Lee Chun-Yu,
Chen Chia-Hsun,
Huang Li-Jen,
Kuo Ya-Pei,
Chen Peng-Yu,
Lu Hsueh-Hsing,
Lee Jiun-Haw
Publication year - 2019
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.13279
Subject(s) - quantum dot , optoelectronics , diode , degradation (telecommunications) , light emitting diode , materials science , blue light , constant current , current (fluid) , physics , telecommunications , computer science , thermodynamics
We have demonstrated that degradation of the hole‐transporting layer material in the blue quantum‐dot light‐emitting diode (QLED) is the main reason accounts for the efficiency loss operated under constant current driving, and the operation lifetime can be elongated by 85% under pulse‐mode driving compared to DC case.