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78‐1: Specular Reflection Measurements on Reflective E‐paper Using a Variable Aperture Source
Author(s) -
Hertel Dirk,
Kelley Edward F.
Publication year - 2019
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.13125
Subject(s) - specular reflection , reflection (computer programming) , optics , aperture (computer memory) , diffuse reflection , specular highlight , light source , materials science , computer science , physics , acoustics , programming language
A newly‐designed variable aperture source (VAS) characterizes specular reflection from electrophoretic e‐paper displays (EPD). This 3D‐printed integrating source with a capsule‐shaped interior combines open‐port uniformity greater than 99% with a sphere‐to‐exit port size ratio below 1.6:1. Interchangeable aperture faceplates vary the source subtense between 1° and 17°. Reflectance vs. subtense curves demonstrated that EPD modulate specular reflection, and anti‐glare surfaces reduce disturbing mirror‐like reflection.