Premium
50‐4: A Novel Evaluation Method for Short‐Residual Image of AMOLED Display
Author(s) -
Peng Jintao,
Peng Kuanjun,
Zhang Fangzhen,
Sun Shuang,
Niu Jing,
Zhou Tingting,
Niu Yanan,
Shi Lubin,
Ren Jinyu
Publication year - 2019
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.13015
Subject(s) - amoled , residual , hysteresis , computer science , process (computing) , image (mathematics) , materials science , artificial intelligence , algorithm , nanotechnology , thin film transistor , layer (electronics) , active matrix , physics , quantum mechanics , operating system
The hysteresis behavior in TFTs caused short‐residual image of AMOLED Display. Hysteresis and optical method are two kinds of traditional evaluation methods. In the practical operation, hysteresis method is not sufficient, and optical method need a product after module process, which has some limitations, such as high production costs, long cycle. In this paper, we provide a novel evaluation method, which can match well with the results of hysteresis and optical method. The novel evaluation has an advantage in accuracy, production costs and cycle, compared with traditional method.