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48‐3: Edge Strength Measurement of Ultra‐Thin LCD Panels
Author(s) -
Jang Bosun,
Priestley Richard,
Tremper Amber,
Ono Toshihiko,
Shu Yin,
Sundaram Balamurugan M.
Publication year - 2019
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.13006
Subject(s) - enhanced data rates for gsm evolution , robustness (evolution) , liquid crystal display , radius , materials science , structural engineering , computer science , composite material , acoustics , engineering , optoelectronics , physics , telecommunications , chemistry , biochemistry , computer security , gene
The feasibility of using Corning's edge strength measurement system (ESMS) for ultra‐thin LCD panels has been demonstrated. Panels were used to validate the load‐to‐stress correlation: digital image correlation, finite element analysis and mirror radius measurement all showed good agreement, supporting the robustness of the strength measurement. The edge strength of panels was measured by both static and dynamic ESMS. Test results revealed that dynamic ESMS is advantaged over static in better capturing the relevant flaw population owing to its larger test area. Accurate edge strength measurement via ESMS coupled with selective fracture analysis on the weakest flaws will assist in improving the edge strength of ultra‐thin LCD panels