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40‐4: High‐Temperature Operational Stability of Deep‐Red Phosphorescent OLED with Exciplex‐Forming Host Material and Guest Material
Author(s) -
Yamaguchi Tomoya,
Inoue Hideko,
Kido Hiromitsu,
Sasaki Toshiki,
Ohsawa Nobuharu,
Seo Satoshi,
Yamazaki Shunpei
Publication year - 2019
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.12981
Subject(s) - phosphorescence , oled , excimer , dopant , materials science , diode , optoelectronics , host (biology) , thermal stability , doping , chemistry , fluorescence , nanotechnology , optics , physics , organic chemistry , ecology , layer (electronics) , biology
Our deep‐red phosphorescent organic light‐emitting diode (OLED) demonstrated a long lifetime at 85°C. This durability was derived not only from a stable exciplex host but also from a dopant with high thermal resistivity. The exciplex host made by a premix technique also worked as well as that made by co‐deposition.