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19‐2: Impact of Chemical Degradation at HTL/EML Interface on Device Performance of Blue OLEDs
Author(s) -
Jiang Yibin,
Zhou Dong-Ying,
Dong Shou-Cheng,
Tang Ching W.
Publication year - 2019
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.12903
Subject(s) - oled , degradation (telecommunications) , dissociation (chemistry) , photochemistry , materials science , optoelectronics , chemistry , nanotechnology , layer (electronics) , computer science , telecommunications
We examined the impact of chemical degradations at the HTL/EML interface on blue OLED performance. Our study showed that photo‐induced C‐N dissociation of HTL materials has little effect on the blue OLED lifetime while photochemical reactions with water/oxygen on the HTL surface can severely degrade the device efficiency and lifetime.