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15‐4: Multi‐Output Oxide TFT Shift Register without Bootstrapping Degradation
Author(s) -
Kim Young In,
Park Seongjun,
Nam Hyoungsik
Publication year - 2019
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.12890
Subject(s) - thin film transistor , node (physics) , degradation (telecommunications) , computer science , bootstrapping (finance) , voltage , materials science , electrical engineering , engineering , telecommunications , mathematics , nanotechnology , layer (electronics) , econometrics , structural engineering
This paper suggests a method which can reduce the number of TFTs of oxide TFT shift registers for narrow bezel display devices. The proposed circuit is the extended version of a previous study that contains node‐sharing structure with LTPS TFTs. With further consideration about the depletion‐mode oxide TFT, this circuit also achieves a stable operation with node‐sharing structure. The simulation results verify that all the pull‐up nodes with separating TFTs are boosted enough without any voltage degradation of output pulses.