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10‐3: High Refractive Index Glass Wafers for Augmented Reality Devices using Waveguide Technology: Recent Advances in Control of Quality Parameters and their Correlation with Device Properties
Author(s) -
Sprengard Ruediger,
Sjogren Brian,
Nass Peter,
Ottermann Clemens,
Lange Berthold,
Damm Thorsten,
Plapper Volker,
Dietrich Volker,
Maurer Ulrich,
Fang Helen,
Weng Nicolas,
Wang Alex,
Apitz Dirk,
Brauneck Ulf,
Wyrowski F.,
Hellmann C.,
Crailsheim H.
Publication year - 2019
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.12869
Subject(s) - wafer , brightness , augmented reality , image quality , computer science , homogeneity (statistics) , materials science , refractive index , optics , quality (philosophy) , waveguide , distortion (music) , optoelectronics , electronic engineering , artificial intelligence , engineering , image (mathematics) , physics , amplifier , cmos , quantum mechanics , machine learning
Waveguide Technology is widely believed to constitute one of the most promising approaches to realize affordable Augmented Reality (AR) / Mixed Reality (MR) devices combining smallest form‐factor with uncompromised image quality allowing for full immersion user experience. Optical waveguides are made from special grade glass wafers. The characteristics of such wafers are directly determining image properties, such as Field‐of‐View, contrast, brightness, distortion of the image projected into the user's eye and many more. We are reporting latest advances in measuring and controlling key quality parameters with focus on total thickness variation, optical homogeneity and thickness tolerance of the wafers. We discuss the impact of these parameters on image quality using optical modelling of the waveguides.