13.1:  Invited Paper:  Single‐Photon‐Capable Detector Arrays in CMOS—Exploring a New Tool for Display Metrology | Zendy

Underwood Ian | Zendy; Mai Hanning | Zendy; Al-Abbas Tarek | Zendy; Gyongy Istvan | Zendy; Dutton Neale A.W. | Zendy; Henderson Robert K. | Zendy

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13.1: Invited Paper: Single‐Photon‐Capable Detector Arrays in CMOS—Exploring a New Tool for Display Metrology

Author(s) -

Underwood Ian,

Mai Hanning,

Al-Abbas Tarek,

Gyongy Istvan,

Dutton Neale A.W.,

Henderson Robert K.

Publication year - 2018

Publication title -

sid symposium digest of technical papers

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.351

H-Index - 44

eISSN - 2168-0159

pISSN - 0097-966X

DOI - 10.1002/sdtp.12838

Subject(s) - cmos , metrology , detector , single photon avalanche diode , diode , photon , point (geometry) , physics , electrical engineering , optoelectronics , computer science , engineering , optics , avalanche photodiode , geometry , mathematics

The technology of CMOS‐compatible Single Photon Avalanche Diodes is evolving rapidly and has matured to the point at which it can address the requirements of a range of imaging applications. In this report we consider the current suitability and future potential of CMOS‐compatible Single Photon Avalanche Diodes to address the particular application of display metrology.

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