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43.2: Low Surface Roughness Transparent Conductive Electrode for QLED Applications
Author(s) -
Chen Xiaolian,
Guo Wenrui,
Xie Liming,
Zhuang Jinyong,
Su Wenming,
Cui Zheng
Publication year - 2018
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.12756
Subject(s) - materials science , sheet resistance , electrode , surface roughness , transmittance , electrical conductor , optoelectronics , surface finish , metal , diode , composite material , metallurgy , layer (electronics) , chemistry
Ag/Ni metal‐mesh transparent conductive electrodes(TCE) with low surface roughness of 0.17 nm has been proposed. The fabricated Ag/Ni metal‐mesh TCE has a low sheet resistance of 2.1 Ω/□ and a high transmittance of 88.6%. Ag/Ni metal‐mesh TCE shows outstanding mechanical flexibility and environmental stability at high temperature and humidity. Using the polished Ag/Ni metal‐mesh TCE, a flexible quantum dot light emitting diodes (QLED) was fabricated with the efficiency of 10.4 cd/A and 3.2 lm/W at 1000 cd/m 2 .