43.2: Low Surface Roughness Transparent Conductive Electrode for QLED Applications | Zendy

Chen Xiaolian | Zendy; Guo Wenrui | Zendy; Xie Liming | Zendy; Zhuang Jinyong | Zendy; Su Wenming | Zendy; Cui Zheng | Zendy

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43.2: Low Surface Roughness Transparent Conductive Electrode for QLED Applications

Author(s) -

Chen Xiaolian,

Guo Wenrui,

Xie Liming,

Zhuang Jinyong,

Su Wenming,

Cui Zheng

Publication year - 2018

Publication title -

sid symposium digest of technical papers

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.351

H-Index - 44

eISSN - 2168-0159

pISSN - 0097-966X

DOI - 10.1002/sdtp.12756

Subject(s) - materials science , sheet resistance , electrode , surface roughness , transmittance , electrical conductor , optoelectronics , surface finish , metal , diode , composite material , metallurgy , layer (electronics) , chemistry

Ag/Ni metal‐mesh transparent conductive electrodes(TCE) with low surface roughness of 0.17 nm has been proposed. The fabricated Ag/Ni metal‐mesh TCE has a low sheet resistance of 2.1 Ω/□ and a high transmittance of 88.6%. Ag/Ni metal‐mesh TCE shows outstanding mechanical flexibility and environmental stability at high temperature and humidity. Using the polished Ag/Ni metal‐mesh TCE, a flexible quantum dot light emitting diodes (QLED) was fabricated with the efficiency of 10.4 cd/A and 3.2 lm/W at 1000 cd/m 2 .

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