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35‐3: Invited Paper: An Electro‐optical OLED Model for Prediction and Compensation of AMOLED Aging Artifacts
Author(s) -
Jiang Xingtong,
Xu Chihao
Publication year - 2018
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.12595
Subject(s) - oled , amoled , compensation (psychology) , materials science , optoelectronics , diode , pixel , degradation (telecommunications) , computer science , electronic engineering , thin film transistor , engineering , artificial intelligence , nanotechnology , active matrix , psychology , layer (electronics) , psychoanalysis
For organic light emitting diode (OLED), degradation is one of the most critical issues of display applications. To overcome this demerit, a specific electro‐optical model valid for any aging state may be an effective method for interpretation and prediction of device performance. In this paper a model comprising an equivalent circuit and electro‐optical characteristic for OLED is presented. Parameters at various aging states were extracted from extensive lifetime tests. The model can determine the efficiency decay in dependence of the operation point and allows the pixel‐wise compensation of AMOLED aging artifacts.