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28‐2: A Novel OLED Display Panel with High‐Reliability Integrated Gate Driver Circuit using IGZO TFTs for Large‐Sized UHD TVs
Author(s) -
Shin Hong-Jae,
Takasugi Shinji,
Choi Woo-Seok,
Chang Min-Kyu,
Choi Jae-Yi,
Jeon Sang-Ki,
Yun Seong-Ho,
Park Hee-Whan,
Kim Jin-Mok,
Kim Han-Seop,
Oh Chang-Ho
Publication year - 2018
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.12571
Subject(s) - oled , thin film transistor , reliability (semiconductor) , flat panel display , plasma display , materials science , driver circuit , compensation (psychology) , leakage (economics) , optoelectronics , voltage , threshold voltage , led display , computer science , electrical engineering , transistor , engineering , physics , electrode , psychology , power (physics) , layer (electronics) , quantum mechanics , psychoanalysis , economics , composite material , macroeconomics
We present a novel OLED display panel with high‐reliability integrated gate driver circuit using IGZO TFTs. Our gate driver circuit can drive a large‐sized OLED display not only for displaying images but also for sensing TFT characteristics for external compensation. It functions correctly even when the threshold voltage of TFTs is negative by reducing leakage currents. We have achieved a life time longer than 60,000 hours in a reliability test and successfully applied it to 55‐inch UHD, 65‐inch UHD and 55‐inch FHD OLED displays, which improves cost‐competitiveness of OLED displays against LCDs.