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16‐2: Distinguished Student Paper: Characterization of Electronic Displays using Advanced CMOS Single Photon Avalanche Diode Image Sensors
Author(s) -
Mai Hanning,
Gyongy Istvan,
Dutton Neale A.W.,
Henderson Robert K.,
Underwood Ian
Publication year - 2018
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.12514
Subject(s) - single photon avalanche diode , cmos , pixel , oled , diode , avalanche diode , optoelectronics , characterization (materials science) , image sensor , sampling (signal processing) , materials science , computer science , optics , avalanche photodiode , physics , electrical engineering , detector , engineering , nanotechnology , voltage , breakdown voltage , layer (electronics)
Advanced CMOS Single Photon Avalanche Diode Arrays have the potential to reveal characteristics of electronic display panels that have, until now, been extremely challenging or impossible to measure routinely. We demonstrate the use of a CMOS SPAD array to make optical measurements of pixels of an OLED microdisplay at very high sampling rates, very low light levels and over a very wide dynamic range.