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P‐163: Novel Design and Study of Anti‐crack Dam for CVD Shadow Free
Author(s) -
Ni Jingkai,
Wang Wei,
Sun Zhongyuan,
Zhang Shizheng,
Wang Xiaofen,
Yue Han,
Xue Jinxiang,
Zhou Xiang,
Sui Kai,
Liu Wenqi,
Dong Chao
Publication year - 2018
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.12393
Subject(s) - shadow (psychology) , materials science , layer (electronics) , blocking (statistics) , shadow mask , composite material , forensic engineering , structural engineering , engineering , optics , computer science , physics , psychology , computer network , psychotherapist
OLED TFE inorganic film owns unwished shadow that enlarges border, cracks appear in the same layer. To retract inward TFE border and eliminate the damage of crack, we designed novel anti‐crack dam located in panel bezel. With the help of its blocking effect, inorganic film crack can be eliminated.