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P‐74: Analysis and Validation of TFT‐LCD RGB Mura Mechanism
Author(s) -
Chen Tianfu,
Li Zhongxiu,
Shi Deqin,
Jin Huijun,
Huang Xianjun
Publication year - 2018
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.12236
Subject(s) - mura , rgb color model , liquid crystal display , reliability (semiconductor) , computer science , thin film transistor , reliability engineering , layer (electronics) , artificial intelligence , engineering , materials science , nanotechnology , power (physics) , physics , quantum mechanics , operating system
The influence of photo spacer design and polyimide layer adhesion on RGB mura risk for LCD panels is studied. A method to assess RGB mura risk is developed with corresponding design standards to ensure product reliability requirements are met.
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