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P‐44: Study on the Factor Affecting the Stress Reliability of GOA
Author(s) -
Du Ruifang,
Ma Xiaoye,
Ma Rui,
Gu Xiaofang,
Zhang Donghui,
Liu Guodong,
Lv Fengzhen,
Wang Zhangtao,
Shao Xibin,
Xue Hailin
Publication year - 2018
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.12167
Subject(s) - reset (finance) , reliability (semiconductor) , signal (programming language) , frame (networking) , unit (ring theory) , stress (linguistics) , reliability engineering , noise (video) , computer science , engineering , mathematics , telecommunications , physics , business , artificial intelligence , power (physics) , linguistics , mathematics education , philosophy , finance , quantum mechanics , image (mathematics) , programming language
We fabricated different products with different GOA (Gate driver On Array) designs and did long‐term reliability experiments. Subsequently, we proposed some design suggestions to enhance the reliability of GOA, such as, noise reduction before and after one frame with total reset signal, reset the end unit with total reset signal, and the discharge of active area separated from GOA unit.