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P‐176: Degradation of Blue Phosphorescent and Fluorescent Organic Light‐Emitting Diodes with Thermal Stress
Author(s) -
Lee Song Eun,
Lee Ho Won,
Baek Hyun Jung,
Kim Ho Yong,
Yun Geum Jae,
Kim Woo Young,
Kim Young Kwan
Publication year - 2017
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.12010
Subject(s) - oled , materials science , degradation (telecommunications) , diode , phosphorescence , optoelectronics , stress (linguistics) , luminance , thermal , fluorescence , dielectric spectroscopy , voltage , current density , optics , composite material , chemistry , electrical engineering , electrode , linguistics , philosophy , physics , layer (electronics) , electrochemistry , quantum mechanics , meteorology , engineering
We investigated the influence of external thermal stress on blue OLEDs annealed various temperature to compare their properties to those of pristine device. Current density‐voltage‐luminance and lifetime decrease due to thermal stress, and we also used impedance spectroscopy, to obtain detailed measurements to determine the degradation mechanisms of the devices.