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33‐4: Panel Stress State Determines Light Leakage in Curved LCD
Author(s) -
Greene Raymond G.,
Akarapu Ravindra K.,
Ishikawa Tomohiro,
Vepakomma K. Hemanth
Publication year - 2017
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.11655
Subject(s) - leakage (economics) , liquid crystal display , materials science , bending , flat panel , shear stress , stress (linguistics) , structural engineering , optics , shear (geology) , optoelectronics , composite material , engineering , physics , linguistics , philosophy , economics , macroeconomics
Substrate stress state determines the light leakage (LL) from dark state VA and IPS liquid crystal (LC) curved panels. Membrane stress creates VA but not IPS LL. Shear and bending stress create IPS but not VA LL. This result enables mitigation, design, and possibly new processes/components to enable non‐traditional form factor LCDs.