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P‐146: Dielectric Constant Measurement of Polyimide and Liquid Crystal at Low Frequency
Author(s) -
Lai Cheng-Wei,
Ting Tien-Lun,
Hsu Wen-Hao
Publication year - 2016
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.11023
Subject(s) - polyimide , dielectric , materials science , dielectric dispersion , liquid crystal , dispersion (optics) , metre , liquid crystal display , bridge (graph theory) , layer (electronics) , optoelectronics , optics , analytical chemistry (journal) , physics , permittivity , chemistry , composite material , organic chemistry , quantum mechanics , medicine
In this paper, the dielectric constants of the polyimide alignment layer PI S830 and the liquid crystals LC M367 and LC M184 are characterized by Wien‐bridge oscillator and Agilent LCR meter E4980A. The lowest measurable frequencies are 0.5 Hz and 20 Hz with the oscillator and the LCR meter, respectively. Both materials show normal dielectric dispersion and the tendency is more apparent with PI S830. Extension of measurable frequency by Wien‐bridge oscillator could be very helpful for the future development of low‐frame‐rate LCD's.