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P‐57: A Sponge Design for the Breakage of TFT‐LCD Pad in Reliability Test
Author(s) -
An Xijun,
Song Yong,
Zhu Hong,
Li Zhifu,
Zhang Hongkun,
Long Jun
Publication year - 2016
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.10943
Subject(s) - reliability (semiconductor) , liquid crystal display , breakage , reliability engineering , thin film transistor , engineering , test (biology) , computer science , engineering drawing , materials science , operating system , composite material , geology , world wide web , paleontology , power (physics) , physics , layer (electronics) , quantum mechanics
In this paper, a solution for sponge design was proposed, which can help designers choose suitable sponge thickness at the beginning of the design, thereby the issue of TFT‐LCD pad area broken during reliability test can be prevented, especially when TLT‐LCD used in mobile. And the project lifecycle can be shortened as well.