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72‐1: Invited Paper : Reflection Measurements and Uncertainties Using Sampling Spheres on Flat, Convex, and Concave Displays
Author(s) -
Kelley Edward F.,
Hertel Dirk,
Penczek John,
Boynton Paul
Publication year - 2016
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.10889
Subject(s) - spheres , curvature , sample (material) , regular polygon , curved mirror , measure (data warehouse) , reflection (computer programming) , sampling (signal processing) , optics , diffuse reflection , geometry , physics , mathematics , computer science , detector , database , thermodynamics , programming language , astronomy
A sampling sphere was designed to measure hemispherical diffuse reflection on flat and curved displays. Interchangeable sample ports eliminate the gap between sample port and convex or concave displays. We investigate the measurement uncertainties by comparing sampling spheres to a large integrating sphere, flat to curved display shapes, and results from different labs. The hemispherical diffuse reflectance of flexible e‐paper does not significantly depend on curvature.