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16.1: Invited Paper : Measurement Methods for Quality Control of Coating Uniformity in Solution‐Processed OLED Displays
Author(s) -
Parker Ian,
Johnson Andrew,
Frischknecht Kyle,
Stainer Matthew
Publication year - 2015
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.10327
Subject(s) - oled , luminance , fabrication , materials science , coating , optoelectronics , computer science , optics , nanotechnology , artificial intelligence , physics , layer (electronics) , medicine , alternative medicine , pathology
This paper will describe techniques and metrics for measuring and quantifying the uniformity of organic films used in solution‐based OLED fabrication. Measurements of the uniformity in the physical parameters (such as thickness and topographic profile etc.) are described, as well as the uniformity in the final luminance of the display.

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