16.1:  Invited Paper : Measurement Methods for Quality Control of Coating Uniformity in Solution‐Processed OLED Displays | Zendy

Parker Ian | Zendy; Johnson Andrew | Zendy; Frischknecht Kyle | Zendy; Stainer Matthew | Zendy

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16.1: Invited Paper : Measurement Methods for Quality Control of Coating Uniformity in Solution‐Processed OLED Displays

Author(s) -

Parker Ian,

Johnson Andrew,

Frischknecht Kyle,

Stainer Matthew

Publication year - 2015

Publication title -

sid symposium digest of technical papers

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.351

H-Index - 44

eISSN - 2168-0159

pISSN - 0097-966X

DOI - 10.1002/sdtp.10327

Subject(s) - oled , luminance , fabrication , materials science , coating , optoelectronics , computer science , optics , nanotechnology , artificial intelligence , physics , layer (electronics) , medicine , alternative medicine , pathology

This paper will describe techniques and metrics for measuring and quantifying the uniformity of organic films used in solution‐based OLED fabrication. Measurements of the uniformity in the physical parameters (such as thickness and topographic profile etc.) are described, as well as the uniformity in the final luminance of the display.

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